Memory IC test sockets are used for testing
DDR, LPDDR, eMMC, eUFS, etc. Fast signal transmission, low power, and low noise are required in the test.
Our MBP elastomer sockets are for a
memory IC test socket
with new technology that is strong in impact and can be used for a long time. Experience the advanced SNOW Co., Ltd. technology by optimal
elastomer test socket
solution for memory semiconductor IC provide.
Memory IC test socket solution
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- Applicable products
- DDR, GDDR, LPDDR, eMMC, eUFS, etc.
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- Applicable pitch
- not less than 0.3p but not more than 1.0p
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- Operating temperature
- -55℃ ~ 150℃
-
Features of Elastomer socket for memory IC test
- It has a block-shaped fin structure that is resistant to impacts.
- The resistance deviation between pins is small even when repeated contact is used.
- It is possible to extend thickness and the contact pressure can be lowered.
- It has low pin resistance and can be used for a long time in repeated contact.
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Good places to use
- When the number of socket contacts is high or the long period of use is required
- When a low contact pressure is needed due to the large number of pins of the semiconductor ICs
- When it is necessary to avoid damage caused by impact to semiconductor ICs
- When testing semiconductor ICs with many warpages
- When the operating temperature range is large