SNOW Co., Ltd. has three types of silicon rubber test socket solutions
with different structures tailored to the type of semiconductor IC and usage environment.


silicon rubber test socket

MBP elastomer socket Model 'S' is the thinnest and has the best signal transmission characteristics.

In addition, it is strong against impact and maintains stable resistance even in repeated contact. It is a semiconductor test socket that requires high-speed signal transmission, and it is recommended to use it in a size of 30mmX30mm or less.

MBP elastomer socket : Block structure pin made of Micro Brick Particle (MBP)

  • Conventional Particle(CP)
    The contact surface between particles is small.
    -> It is easy to be defective by physical impact.
    silicon rubber test socket
  • Metal Brick Particle(MBP)
    The contact surface is relatively large.
    -> reduced contact resistance
    Structure with reinforced bonding between particles
    -> strong against physical impact
    silicon rubber test socket

CP Elastomer socket vs MBP Elastomer socket | Repeated Contact Test (Internal test results)

  • MBP elastomer socket reduces pin-to-pin resistance variation and extends lifespan. (Internal test results)
Number of contacts (times) 20,000 40,000 60,000 80,000 100,000
CP Elastomer socket
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket
MBP Elastomer
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket
silicon rubber test socket

Color : Blue (<50mΩ) < Green < Yellow < Red (>200mΩ)

CP PAD vs MBP PAD Top Damage Test
(Internal test, Device ball material : SAC305)

  Initial After 300K Cycles@35g/pin,000  
MBP Pad
silicon rubber test socket
silicon rubber test socket
MBP Pad maintains the pad shape even when impacted.
Conventional
Particles Pad
silicon rubber test socket
silicon rubber test socket
CP pad becomes damaged as
particles separation takes place due to impact.